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Electronic circuits, systems and standards: the best of EDN
Electronic Circuits, Systems and Standards: The Best of EDN is a collection of 66 EDN articles. The topics covered in this collection are diverse but all are relevant to controlled circulation electronics. The coverage of the text includes topics about software and algorithms, such as simple random...
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Lenguaje: | eng |
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Elsevier Science
2013
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Acceso en línea: | http://cds.cern.ch/record/2105443 |
_version_ | 1780948812979765248 |
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author | Hickman, Ian |
author_facet | Hickman, Ian |
author_sort | Hickman, Ian |
collection | CERN |
description | Electronic Circuits, Systems and Standards: The Best of EDN is a collection of 66 EDN articles. The topics covered in this collection are diverse but all are relevant to controlled circulation electronics. The coverage of the text includes topics about software and algorithms, such as simple random number algorithm; simple log algorithm; and efficient algorithm for repeated FFTs. The book also tackles measurement related topics, including test for identifying a Gaussian noise source; enhancing product reliability; and amplitude-locked loop speeds filter test. The text will be useful to student |
id | cern-2105443 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2013 |
publisher | Elsevier Science |
record_format | invenio |
spelling | cern-21054432021-04-21T20:02:21Zhttp://cds.cern.ch/record/2105443engHickman, IanElectronic circuits, systems and standards: the best of EDNEngineeringElectronic Circuits, Systems and Standards: The Best of EDN is a collection of 66 EDN articles. The topics covered in this collection are diverse but all are relevant to controlled circulation electronics. The coverage of the text includes topics about software and algorithms, such as simple random number algorithm; simple log algorithm; and efficient algorithm for repeated FFTs. The book also tackles measurement related topics, including test for identifying a Gaussian noise source; enhancing product reliability; and amplitude-locked loop speeds filter test. The text will be useful to studentElsevier Scienceoai:cds.cern.ch:21054432013 |
spellingShingle | Engineering Hickman, Ian Electronic circuits, systems and standards: the best of EDN |
title | Electronic circuits, systems and standards: the best of EDN |
title_full | Electronic circuits, systems and standards: the best of EDN |
title_fullStr | Electronic circuits, systems and standards: the best of EDN |
title_full_unstemmed | Electronic circuits, systems and standards: the best of EDN |
title_short | Electronic circuits, systems and standards: the best of EDN |
title_sort | electronic circuits, systems and standards: the best of edn |
topic | Engineering |
url | http://cds.cern.ch/record/2105443 |
work_keys_str_mv | AT hickmanian electroniccircuitssystemsandstandardsthebestofedn |