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RD53A Integrated Circuit Specifications
Specifications for the RD53 collaboration’s first engineering wafer run of an integrated circuit (IC) for hybrid pixel detector readout, called RD53A. RD53A is intended to demonstrate in a large format IC the suitability of the technology (including radiation tolerance), the stable low threshold ope...
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Lenguaje: | eng |
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2015
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Acceso en línea: | http://cds.cern.ch/record/2113263 |
_version_ | 1780949028174823424 |
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author | Garcia-Sciveres, Mauricio |
author_facet | Garcia-Sciveres, Mauricio |
author_sort | Garcia-Sciveres, Mauricio |
collection | CERN |
description | Specifications for the RD53 collaboration’s first engineering wafer run of an integrated circuit (IC) for hybrid pixel detector readout, called RD53A. RD53A is intended to demonstrate in a large format IC the suitability of the technology (including radiation tolerance), the stable low threshold operation, and the high hit and trigger rate capabilities, required for HL-LHC upgrades of ATLAS and CMS. The wafer scale production will permit the experiments to prototype bump bonding assembly with realistic sensors in this new technology and to measure the performance of hybrid assemblies. RD53A is not intended to be a final production IC for use in an experiment, and will contain design variations for testing purposes, making the pixel matrix non-uniform. |
id | cern-2113263 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2015 |
record_format | invenio |
spelling | cern-21132632019-09-30T06:29:59Zhttp://cds.cern.ch/record/2113263engGarcia-Sciveres, MauricioRD53A Integrated Circuit SpecificationsSpecifications for the RD53 collaboration’s first engineering wafer run of an integrated circuit (IC) for hybrid pixel detector readout, called RD53A. RD53A is intended to demonstrate in a large format IC the suitability of the technology (including radiation tolerance), the stable low threshold operation, and the high hit and trigger rate capabilities, required for HL-LHC upgrades of ATLAS and CMS. The wafer scale production will permit the experiments to prototype bump bonding assembly with realistic sensors in this new technology and to measure the performance of hybrid assemblies. RD53A is not intended to be a final production IC for use in an experiment, and will contain design variations for testing purposes, making the pixel matrix non-uniform.CERN-RD53-PUB-15-001oai:cds.cern.ch:21132632015 |
spellingShingle | Garcia-Sciveres, Mauricio RD53A Integrated Circuit Specifications |
title | RD53A Integrated Circuit Specifications |
title_full | RD53A Integrated Circuit Specifications |
title_fullStr | RD53A Integrated Circuit Specifications |
title_full_unstemmed | RD53A Integrated Circuit Specifications |
title_short | RD53A Integrated Circuit Specifications |
title_sort | rd53a integrated circuit specifications |
url | http://cds.cern.ch/record/2113263 |
work_keys_str_mv | AT garciasciveresmauricio rd53aintegratedcircuitspecifications |