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RD53A Integrated Circuit Specifications

Specifications for the RD53 collaboration’s first engineering wafer run of an integrated circuit (IC) for hybrid pixel detector readout, called RD53A. RD53A is intended to demonstrate in a large format IC the suitability of the technology (including radiation tolerance), the stable low threshold ope...

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Autor principal: Garcia-Sciveres, Mauricio
Lenguaje:eng
Publicado: 2015
Acceso en línea:http://cds.cern.ch/record/2113263
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author Garcia-Sciveres, Mauricio
author_facet Garcia-Sciveres, Mauricio
author_sort Garcia-Sciveres, Mauricio
collection CERN
description Specifications for the RD53 collaboration’s first engineering wafer run of an integrated circuit (IC) for hybrid pixel detector readout, called RD53A. RD53A is intended to demonstrate in a large format IC the suitability of the technology (including radiation tolerance), the stable low threshold operation, and the high hit and trigger rate capabilities, required for HL-LHC upgrades of ATLAS and CMS. The wafer scale production will permit the experiments to prototype bump bonding assembly with realistic sensors in this new technology and to measure the performance of hybrid assemblies. RD53A is not intended to be a final production IC for use in an experiment, and will contain design variations for testing purposes, making the pixel matrix non-uniform.
id cern-2113263
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
record_format invenio
spelling cern-21132632019-09-30T06:29:59Zhttp://cds.cern.ch/record/2113263engGarcia-Sciveres, MauricioRD53A Integrated Circuit SpecificationsSpecifications for the RD53 collaboration’s first engineering wafer run of an integrated circuit (IC) for hybrid pixel detector readout, called RD53A. RD53A is intended to demonstrate in a large format IC the suitability of the technology (including radiation tolerance), the stable low threshold operation, and the high hit and trigger rate capabilities, required for HL-LHC upgrades of ATLAS and CMS. The wafer scale production will permit the experiments to prototype bump bonding assembly with realistic sensors in this new technology and to measure the performance of hybrid assemblies. RD53A is not intended to be a final production IC for use in an experiment, and will contain design variations for testing purposes, making the pixel matrix non-uniform.CERN-RD53-PUB-15-001oai:cds.cern.ch:21132632015
spellingShingle Garcia-Sciveres, Mauricio
RD53A Integrated Circuit Specifications
title RD53A Integrated Circuit Specifications
title_full RD53A Integrated Circuit Specifications
title_fullStr RD53A Integrated Circuit Specifications
title_full_unstemmed RD53A Integrated Circuit Specifications
title_short RD53A Integrated Circuit Specifications
title_sort rd53a integrated circuit specifications
url http://cds.cern.ch/record/2113263
work_keys_str_mv AT garciasciveresmauricio rd53aintegratedcircuitspecifications