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Formation and annealing of metastable (interstitial oxygen)-(interstitial carbon) complexes in n- and p-type silicon

It is shown experimentally that, in contrast to the stable configuration of (interstitial carbon)-(interstitial oxygen) complexes (CiOi), the corresponding metastable configuration (CiOi{*}) cannot be found in n-Si based structures by the method of capacitance spectroscopy. The rates of transformati...

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Detalles Bibliográficos
Autores principales: Makarenko, L F, Korshunov, F P, Lastovskii, S B, Murin, L I, Moll, M, Pintilie, I
Lenguaje:eng
Publicado: 2014
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1134/S1063782614110141
http://cds.cern.ch/record/2120336

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