Cargando…
Forward current enhanced elimination of the radiation induced boron-oxygen complex in silicon n+-p diodes
Using forward current injection with densities in the range 15-30A/cm(2) we can effectively eliminate the radiation-induced boron-oxygen complex, which is the main compensating center in irradiated Si solar cells. It was found that for a given forward current density the elimination rate is decreasi...
Autores principales: | Makarenko, L F, Lastovskii, S B, Yakushevich, H S, Moll, M, Pintilie, I |
---|---|
Lenguaje: | eng |
Publicado: |
2014
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1002/pssa.201431315 http://cds.cern.ch/record/2120379 |
Ejemplares similares
-
Effect of electron injection on defect reactions in irradiated silicon containing boron, carbon, and oxygen
por: Makarenko, L F, et al.
Publicado: (2018) -
Formation and annealing of boron-oxygen defects in irradiated silicon and silicon-germanium n$^+$–p structures
por: Makarenko, L F, et al.
Publicado: (2015) -
Formation and annealing of metastable (interstitial oxygen)-(interstitial carbon) complexes in n- and p-type silicon
por: Makarenko, L F, et al.
Publicado: (2014) -
The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon Diodes
por: Liao, C, et al.
Publicado: (2022) -
Formation of a Bistable Interstitial Complex in Irradiated p‐Type Silicon
por: Makarenko, Leonid F, et al.
Publicado: (2019)