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Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
In the period October 21 – 28, 2015, the CMS HCAL group did a radiation tolerance study for the Phase I Upgrade HF, HE and HB front end electronics. The test was conducted at the CERN CHARM facility, which is a mixed field radiation facility. No permanent damages were observed. Effects observed duri...
Autores principales: | , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2016
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2128433 |
Sumario: | In the period October 21 – 28, 2015, the CMS HCAL group did a radiation tolerance study for the Phase I Upgrade HF, HE and HB front end electronics. The test was conducted at the CERN CHARM facility, which is a mixed field radiation facility. No permanent damages were observed. Effects observed during the irradiation are presented. |
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