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Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN

In the period October 21 – 28, 2015, the CMS HCAL group did a radiation tolerance study for the Phase I Upgrade HF, HE and HB front end electronics. The test was conducted at the CERN CHARM facility, which is a mixed field radiation facility. No permanent damages were observed. Effects observed duri...

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Detalles Bibliográficos
Autores principales: Grassi, Tullio, Costanza, Francesco, Karakaya, Tugba, Sahin, Mehmet Ozgur, Lincoln, Don, Strobbe, Nadja, Kaminskiy, Alexander, Tlisov, Danila, Wang, Yanchu, Hirschauer, James Francis
Lenguaje:eng
Publicado: 2016
Materias:
Acceso en línea:http://cds.cern.ch/record/2128433
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author Grassi, Tullio
Costanza, Francesco
Karakaya, Tugba
Sahin, Mehmet Ozgur
Lincoln, Don
Strobbe, Nadja
Kaminskiy, Alexander
Tlisov, Danila
Wang, Yanchu
Hirschauer, James Francis
author_facet Grassi, Tullio
Costanza, Francesco
Karakaya, Tugba
Sahin, Mehmet Ozgur
Lincoln, Don
Strobbe, Nadja
Kaminskiy, Alexander
Tlisov, Danila
Wang, Yanchu
Hirschauer, James Francis
author_sort Grassi, Tullio
collection CERN
description In the period October 21 – 28, 2015, the CMS HCAL group did a radiation tolerance study for the Phase I Upgrade HF, HE and HB front end electronics. The test was conducted at the CERN CHARM facility, which is a mixed field radiation facility. No permanent damages were observed. Effects observed during the irradiation are presented.
id cern-2128433
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
record_format invenio
spelling cern-21284332019-09-30T06:29:59Zhttp://cds.cern.ch/record/2128433engGrassi, TullioCostanza, FrancescoKarakaya, TugbaSahin, Mehmet OzgurLincoln, DonStrobbe, NadjaKaminskiy, AlexanderTlisov, DanilaWang, YanchuHirschauer, James FrancisIrradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERNDetectors and Experimental TechniquesIn the period October 21 – 28, 2015, the CMS HCAL group did a radiation tolerance study for the Phase I Upgrade HF, HE and HB front end electronics. The test was conducted at the CERN CHARM facility, which is a mixed field radiation facility. No permanent damages were observed. Effects observed during the irradiation are presented.CERN-OPEN-2016-001oai:cds.cern.ch:21284332016-02-02
spellingShingle Detectors and Experimental Techniques
Grassi, Tullio
Costanza, Francesco
Karakaya, Tugba
Sahin, Mehmet Ozgur
Lincoln, Don
Strobbe, Nadja
Kaminskiy, Alexander
Tlisov, Danila
Wang, Yanchu
Hirschauer, James Francis
Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
title Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
title_full Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
title_fullStr Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
title_full_unstemmed Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
title_short Irradiation test of the HCAL Forward and Endcap upgrade electronics at the CHARM facility at CERN
title_sort irradiation test of the hcal forward and endcap upgrade electronics at the charm facility at cern
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/2128433
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AT costanzafrancesco irradiationtestofthehcalforwardandendcapupgradeelectronicsatthecharmfacilityatcern
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AT sahinmehmetozgur irradiationtestofthehcalforwardandendcapupgradeelectronicsatthecharmfacilityatcern
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