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Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders
In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expec...
Autores principales: | , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2016
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/NSSMIC.2015.7581815 http://cds.cern.ch/record/2142577 |
_version_ | 1780950187689115648 |
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author | Nowak, Sebastian Abovyan, Sergey Gadow, Philipp Ecker, Katharina Fink, David Fras, Markus Kortner, Oliver Kroha, Hubert Müller, Felix Richter, Robert Schmid, Clemens Schmidt-Sommerfeld, Korbinian Zhao, Yazhou |
author_facet | Nowak, Sebastian Abovyan, Sergey Gadow, Philipp Ecker, Katharina Fink, David Fras, Markus Kortner, Oliver Kroha, Hubert Müller, Felix Richter, Robert Schmid, Clemens Schmidt-Sommerfeld, Korbinian Zhao, Yazhou |
author_sort | Nowak, Sebastian |
collection | CERN |
description | In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates. |
id | cern-2142577 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2016 |
record_format | invenio |
spelling | cern-21425772023-03-14T20:15:44Zdoi:10.1109/NSSMIC.2015.7581815http://cds.cern.ch/record/2142577engNowak, SebastianAbovyan, SergeyGadow, PhilippEcker, KatharinaFink, DavidFras, MarkusKortner, OliverKroha, HubertMüller, FelixRichter, RobertSchmid, ClemensSchmidt-Sommerfeld, KorbinianZhao, YazhouOptimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future CollidersDetectors and Experimental TechniquesIn the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq <sup>90</sup> Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.arXiv:1603.08841MPP-2015-284MPP-2015-284oai:cds.cern.ch:21425772016-03-29 |
spellingShingle | Detectors and Experimental Techniques Nowak, Sebastian Abovyan, Sergey Gadow, Philipp Ecker, Katharina Fink, David Fras, Markus Kortner, Oliver Kroha, Hubert Müller, Felix Richter, Robert Schmid, Clemens Schmidt-Sommerfeld, Korbinian Zhao, Yazhou Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders |
title | Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders |
title_full | Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders |
title_fullStr | Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders |
title_full_unstemmed | Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders |
title_short | Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders |
title_sort | optimisation of the read-out electronics of muon drift-tube chambers for very high background rates at hl-lhc and future colliders |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1109/NSSMIC.2015.7581815 http://cds.cern.ch/record/2142577 |
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