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Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC

The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter (TDC) and the versatility of a waveform digitizer to perform accurate timing measureme...

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Autores principales: Breton, Dominique, De Cacqueray, Victor, Delagnes, Éric, Grabas, Hervé, Maalmi, Jihane, Minafra, Nicola, Royon, Christophe, Saimpert, Matthias
Lenguaje:eng
Publicado: 2016
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2016.08.019
http://cds.cern.ch/record/2145204
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author Breton, Dominique
De Cacqueray, Victor
Delagnes, Éric
Grabas, Hervé
Maalmi, Jihane
Minafra, Nicola
Royon, Christophe
Saimpert, Matthias
author_facet Breton, Dominique
De Cacqueray, Victor
Delagnes, Éric
Grabas, Hervé
Maalmi, Jihane
Minafra, Nicola
Royon, Christophe
Saimpert, Matthias
author_sort Breton, Dominique
collection CERN
description The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter (TDC) and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to maximize time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using Gaussian signals generated by a signal generator or by silicon detectors pulsed with an infra-red laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 (40) ps with synthesized (silicon detector) signals.
id cern-2145204
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
record_format invenio
spelling cern-21452042022-04-22T08:39:51Zdoi:10.1016/j.nima.2016.08.019http://cds.cern.ch/record/2145204engBreton, DominiqueDe Cacqueray, VictorDelagnes, ÉricGrabas, HervéMaalmi, JihaneMinafra, NicolaRoyon, ChristopheSaimpert, MatthiasMeasurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDCDetectors and Experimental TechniquesThe SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter (TDC) and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to maximize time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using Gaussian signals generated by a signal generator or by silicon detectors pulsed with an infra-red laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 (40) ps with synthesized (silicon detector) signals.The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.arXiv:1604.02385oai:cds.cern.ch:21452042016-04-08
spellingShingle Detectors and Experimental Techniques
Breton, Dominique
De Cacqueray, Victor
Delagnes, Éric
Grabas, Hervé
Maalmi, Jihane
Minafra, Nicola
Royon, Christophe
Saimpert, Matthias
Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
title Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
title_full Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
title_fullStr Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
title_full_unstemmed Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
title_short Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
title_sort measurements of timing resolution of ultra-fast silicon detectors with the sampic wtdc
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2016.08.019
http://cds.cern.ch/record/2145204
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