Cargando…
Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC
The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter (TDC) and the versatility of a waveform digitizer to perform accurate timing measureme...
Autores principales: | , , , , , , , |
---|---|
Lenguaje: | eng |
Publicado: |
2016
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2016.08.019 http://cds.cern.ch/record/2145204 |
_version_ | 1780950295856021504 |
---|---|
author | Breton, Dominique De Cacqueray, Victor Delagnes, Éric Grabas, Hervé Maalmi, Jihane Minafra, Nicola Royon, Christophe Saimpert, Matthias |
author_facet | Breton, Dominique De Cacqueray, Victor Delagnes, Éric Grabas, Hervé Maalmi, Jihane Minafra, Nicola Royon, Christophe Saimpert, Matthias |
author_sort | Breton, Dominique |
collection | CERN |
description | The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter (TDC) and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to maximize time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using Gaussian signals generated by a signal generator or by silicon detectors pulsed with an infra-red laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 (40) ps with synthesized (silicon detector) signals. |
id | cern-2145204 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2016 |
record_format | invenio |
spelling | cern-21452042022-04-22T08:39:51Zdoi:10.1016/j.nima.2016.08.019http://cds.cern.ch/record/2145204engBreton, DominiqueDe Cacqueray, VictorDelagnes, ÉricGrabas, HervéMaalmi, JihaneMinafra, NicolaRoyon, ChristopheSaimpert, MatthiasMeasurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDCDetectors and Experimental TechniquesThe SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter (TDC) and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to maximize time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using Gaussian signals generated by a signal generator or by silicon detectors pulsed with an infra-red laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 (40) ps with synthesized (silicon detector) signals.The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.The SAMpler for PICosecond time (SAMPIC) chip has been designed by a collaboration including CEA/IRFU/SEDI, Saclay and CNRS/LAL/SERDI, Orsay. It benefits from both the quick response of a time to digital converter and the versatility of a waveform digitizer to perform accurate timing measurements. Thanks to the sampled signals, smart algorithms making best use of the pulse shape can be used to improve time resolution. A software framework has been developed to analyse the SAMPIC output data and extract timing information by using either a constant fraction discriminator or a fast cross-correlation algorithm. SAMPIC timing capabilities together with the software framework have been tested using pulses generated by a signal generator or by a silicon detector illuminated by a pulsed infrared laser. Under these ideal experimental conditions, the SAMPIC chip has proven to be capable of timing resolutions down to 4 ps with synthesized signals and 40 ps with silicon detector signals.arXiv:1604.02385oai:cds.cern.ch:21452042016-04-08 |
spellingShingle | Detectors and Experimental Techniques Breton, Dominique De Cacqueray, Victor Delagnes, Éric Grabas, Hervé Maalmi, Jihane Minafra, Nicola Royon, Christophe Saimpert, Matthias Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC |
title | Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC |
title_full | Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC |
title_fullStr | Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC |
title_full_unstemmed | Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC |
title_short | Measurements of timing resolution of ultra-fast silicon detectors with the SAMPIC WTDC |
title_sort | measurements of timing resolution of ultra-fast silicon detectors with the sampic wtdc |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1016/j.nima.2016.08.019 http://cds.cern.ch/record/2145204 |
work_keys_str_mv | AT bretondominique measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT decacquerayvictor measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT delagneseric measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT grabasherve measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT maalmijihane measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT minafranicola measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT royonchristophe measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc AT saimpertmatthias measurementsoftimingresolutionofultrafastsilicondetectorswiththesampicwtdc |