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Principles of semiconductor network testing
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Butterworth-Heinemann
1995
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2152830 |
| _version_ | 1780950547942080512 |
|---|---|
| author | Afshar, Amir |
| author_facet | Afshar, Amir |
| author_sort | Afshar, Amir |
| collection | CERN |
| id | cern-2152830 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1995 |
| publisher | Butterworth-Heinemann |
| record_format | invenio |
| spelling | cern-21528302020-07-16T20:02:46Zhttp://cds.cern.ch/record/2152830engAfshar, AmirPrinciples of semiconductor network testingEngineeringButterworth-Heinemannoai:cds.cern.ch:21528301995 |
| spellingShingle | Engineering Afshar, Amir Principles of semiconductor network testing |
| title | Principles of semiconductor network testing |
| title_full | Principles of semiconductor network testing |
| title_fullStr | Principles of semiconductor network testing |
| title_full_unstemmed | Principles of semiconductor network testing |
| title_short | Principles of semiconductor network testing |
| title_sort | principles of semiconductor network testing |
| topic | Engineering |
| url | http://cds.cern.ch/record/2152830 |
| work_keys_str_mv | AT afsharamir principlesofsemiconductornetworktesting |