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Field and temperature scaling of the critical current density in commercial REBCO coated conductors

Scaling relations describing the electromagnetic behaviour of coated conductors (CCs) greatly simplify the design of REBCO-based devices. The performance of REBCO CCs is strongly influenced by fabrication route, conductor architecture and materials, and these parameters vary from one manufacturer to...

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Detalles Bibliográficos
Autores principales: Senatore, Carmine, Barth, Christian, Bonura, Marco, Kulich, Miloslav, Mondonico, Giorgio
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: Supercond. Sci. Technol. 2016
Materias:
Acceso en línea:https://dx.doi.org/10.1088/0953-2048/29/1/014002
http://cds.cern.ch/record/2159560
Descripción
Sumario:Scaling relations describing the electromagnetic behaviour of coated conductors (CCs) greatly simplify the design of REBCO-based devices. The performance of REBCO CCs is strongly influenced by fabrication route, conductor architecture and materials, and these parameters vary from one manufacturer to the others. In the present work we have examined the critical surface for the current density, Jc(T,B,θ ), of coated conductors from six different manufacturers: American Superconductor Co. (US), Bruker HTS GmbH (Germany), Fujikura Ltd. (Japan), SuNAM Co. Ltd. (Korea), SuperOx ZAO (Russia) and SuperPower Inc. (US). Electrical transport and magnetic measurements were performed at temperatures between 4.2 K and 77 K and in magnetic field up to 19 T. Experiments were conducted at three different orientations of the field with respect to the crystallographic c-axis of the REBCO layer, θ = 0deg , 45deg and 90deg , in order to probe the angular anisotropy of Jc. In spite of the large variability of CCs performance, we show here that field and temperature dependences of Jc at a given angle can be reproduced over wide ranges using a scaling relation based only on three parameters. Furthermore, we present and validate a new approach combining magnetic and transport measurements for the determination of the scaling parameters with minimal experimental effort.