Cargando…
SEE on Different Layers of Stacked-SRAMs
This paper presents heavy-ion and proton radiation test results of a 90 nm COTS SRAM with stacked structure. Radiation tests were made using high penetration heavy-ion cocktails at the HIF (Belgium) and at RADEF (Finland) as well as low energy protons at RADEF. The heavy-ion SEU cross-section showed...
Autores principales: | Gupta, V, Bosser, A, Tsiligiannis, G, Rousselet, M, Mohammadzadeh, A, Javanainen, A, Virtanen, A, Puchner, H, Saigné, F, Wrobel, F, Dilillo, L |
---|---|
Lenguaje: | eng |
Publicado: |
2015
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1109/TNS.2015.2496725 http://cds.cern.ch/record/2161073 |
Ejemplares similares
-
An SRAM Based Monitor for Mixed-Field Radiation Environments
por: Tsiligiannis, G, et al.
Publicado: (2014) -
Evaluating a radiation monitor for mixed-field environments based on SRAM technology
por: Tsiligiannis, G, et al.
Publicado: (2014) -
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory
por: Bosser, A L, et al.
Publicado: (2018) -
Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions
por: Gupta, V., et al.
Publicado: (2015) -
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
por: Bosser, A, et al.
Publicado: (2015)