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Selection of TSV process
| Autor principal: | |
|---|---|
| Formato: | info:eu-repo/semantics/article |
| Lenguaje: | eng |
| Publicado: |
2016
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2201601 |
| _version_ | 1780951315332988928 |
|---|---|
| author | Re, V. |
| author_facet | Re, V. |
| author_sort | Re, V. |
| collection | CERN |
| format | info:eu-repo/semantics/article |
| id | cern-2201601 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2016 |
| record_format | invenio |
| spelling | cern-22016012019-09-30T06:29:59Z http://cds.cern.ch/record/2201601 eng Re, V. Selection of TSV process Detectors and Experimental Techniques 4: Micro-electronics and interconnections info:eu-repo/grantAgreement/EC/FP7/654168 info:eu-repo/semantics/openAccess Education Level info:eu-repo/semantics/article http://cds.cern.ch/record/2201601 2016 |
| spellingShingle | Detectors and Experimental Techniques 4: Micro-electronics and interconnections Re, V. Selection of TSV process |
| title | Selection of TSV process |
| title_full | Selection of TSV process |
| title_fullStr | Selection of TSV process |
| title_full_unstemmed | Selection of TSV process |
| title_short | Selection of TSV process |
| title_sort | selection of tsv process |
| topic | Detectors and Experimental Techniques 4: Micro-electronics and interconnections |
| url | http://cds.cern.ch/record/2201601 http://cds.cern.ch/record/2201601 |
| work_keys_str_mv | AT rev selectionoftsvprocess |