Study of etching processes in the GEM detectors

Gaseous Electron Multiplier (GEM) detectors are known to operate stably at high gains and high particle fluxes. Though, at very high gains and fluxes it was observed that the insulating polyimide layer between the GEM electrodes gets etched, changing the original shape of the hole, and therefore var...

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Autor principal: Zavazieva, Darina
Lenguaje:eng
Publicado: 2016
Materias:
Physics in General
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/2209076
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author Zavazieva, Darina
author_facet Zavazieva, Darina
author_sort Zavazieva, Darina
collection CERN
description Gaseous Electron Multiplier (GEM) detectors are known to operate stably at high gains and high particle fluxes. Though, at very high gains and fluxes it was observed that the insulating polyimide layer between the GEM electrodes gets etched, changing the original shape of the hole, and therefore varying the gain and the energy resolution of the detector. The idea of the project to observe degradation effect of the GEM foils during the Triple GEM detector operation in extreme conditions under X-ray radiation.
id cern-2209076
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
record_format invenio
spelling cern-22090762019-09-30T06:29:59Zhttp://cds.cern.ch/record/2209076engZavazieva, DarinaStudy of etching processes in the GEM detectorsPhysics in GeneralDetectors and Experimental TechniquesGaseous Electron Multiplier (GEM) detectors are known to operate stably at high gains and high particle fluxes. Though, at very high gains and fluxes it was observed that the insulating polyimide layer between the GEM electrodes gets etched, changing the original shape of the hole, and therefore varying the gain and the energy resolution of the detector. The idea of the project to observe degradation effect of the GEM foils during the Triple GEM detector operation in extreme conditions under X-ray radiation.CERN-STUDENTS-Note-2016-078oai:cds.cern.ch:22090762016-08-19
spellingShingle Physics in General
Detectors and Experimental Techniques
Zavazieva, Darina
Study of etching processes in the GEM detectors
title Study of etching processes in the GEM detectors
title_full Study of etching processes in the GEM detectors
title_fullStr Study of etching processes in the GEM detectors
title_full_unstemmed Study of etching processes in the GEM detectors
title_short Study of etching processes in the GEM detectors
title_sort study of etching processes in the gem detectors
topic Physics in General
Detectors and Experimental Techniques
url http://cds.cern.ch/record/2209076
work_keys_str_mv AT zavazievadarina studyofetchingprocessesinthegemdetectors

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