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Study of etching processes in the GEM detectors
Gaseous Electron Multiplier (GEM) detectors are known to operate stably at high gains and high particle fluxes. Though, at very high gains and fluxes it was observed that the insulating polyimide layer between the GEM electrodes gets etched, changing the original shape of the hole, and therefore var...
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| Lenguaje: | eng |
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2016
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| Acceso en línea: | http://cds.cern.ch/record/2209076 |