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Multilabel classification: problem analysis, metrics and techniques

Detalles Bibliográficos
Autores principales: Charte, Francisco, Rivera, Antonio J, del Jesus, María J
Lenguaje:eng
Publicado: Springer 2016
Materias:
Acceso en línea:http://cds.cern.ch/record/2212707
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author Charte, Francisco
Rivera, Antonio J
del Jesus, María J
author_facet Charte, Francisco
Rivera, Antonio J
del Jesus, María J
author_sort Charte, Francisco
collection CERN
id cern-2212707
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
publisher Springer
record_format invenio
spelling cern-22127072021-04-21T19:32:40Zhttp://cds.cern.ch/record/2212707engCharte, FranciscoRivera, Antonio Jdel Jesus, María JMultilabel classification: problem analysis, metrics and techniquesComputing and ComputersSpringeroai:cds.cern.ch:22127072016
spellingShingle Computing and Computers
Charte, Francisco
Rivera, Antonio J
del Jesus, María J
Multilabel classification: problem analysis, metrics and techniques
title Multilabel classification: problem analysis, metrics and techniques
title_full Multilabel classification: problem analysis, metrics and techniques
title_fullStr Multilabel classification: problem analysis, metrics and techniques
title_full_unstemmed Multilabel classification: problem analysis, metrics and techniques
title_short Multilabel classification: problem analysis, metrics and techniques
title_sort multilabel classification: problem analysis, metrics and techniques
topic Computing and Computers
url http://cds.cern.ch/record/2212707
work_keys_str_mv AT chartefrancisco multilabelclassificationproblemanalysismetricsandtechniques
AT riveraantonioj multilabelclassificationproblemanalysismetricsandtechniques
AT deljesusmariaj multilabelclassificationproblemanalysismetricsandtechniques