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Multilabel classification: problem analysis, metrics and techniques
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
Springer
2016
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2212707 |
_version_ | 1780951891729973248 |
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author | Charte, Francisco Rivera, Antonio J del Jesus, María J |
author_facet | Charte, Francisco Rivera, Antonio J del Jesus, María J |
author_sort | Charte, Francisco |
collection | CERN |
id | cern-2212707 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2016 |
publisher | Springer |
record_format | invenio |
spelling | cern-22127072021-04-21T19:32:40Zhttp://cds.cern.ch/record/2212707engCharte, FranciscoRivera, Antonio Jdel Jesus, María JMultilabel classification: problem analysis, metrics and techniquesComputing and ComputersSpringeroai:cds.cern.ch:22127072016 |
spellingShingle | Computing and Computers Charte, Francisco Rivera, Antonio J del Jesus, María J Multilabel classification: problem analysis, metrics and techniques |
title | Multilabel classification: problem analysis, metrics and techniques |
title_full | Multilabel classification: problem analysis, metrics and techniques |
title_fullStr | Multilabel classification: problem analysis, metrics and techniques |
title_full_unstemmed | Multilabel classification: problem analysis, metrics and techniques |
title_short | Multilabel classification: problem analysis, metrics and techniques |
title_sort | multilabel classification: problem analysis, metrics and techniques |
topic | Computing and Computers |
url | http://cds.cern.ch/record/2212707 |
work_keys_str_mv | AT chartefrancisco multilabelclassificationproblemanalysismetricsandtechniques AT riveraantonioj multilabelclassificationproblemanalysismetricsandtechniques AT deljesusmariaj multilabelclassificationproblemanalysismetricsandtechniques |