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Spectroscopic analysis of optoelectronic semiconductors

This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get...

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Detalles Bibliográficos
Autores principales: Jimenez, Juan, Tomm, Jens W
Lenguaje:eng
Publicado: Springer 2016
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-42349-4
http://cds.cern.ch/record/2213109
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author Jimenez, Juan
Tomm, Jens W
author_facet Jimenez, Juan
Tomm, Jens W
author_sort Jimenez, Juan
collection CERN
description This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.
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institution Organización Europea para la Investigación Nuclear
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publishDate 2016
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spelling cern-22131092021-04-21T19:32:25Zdoi:10.1007/978-3-319-42349-4http://cds.cern.ch/record/2213109engJimenez, JuanTomm, Jens WSpectroscopic analysis of optoelectronic semiconductorsOther Fields of PhysicsThis book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.Springeroai:cds.cern.ch:22131092016
spellingShingle Other Fields of Physics
Jimenez, Juan
Tomm, Jens W
Spectroscopic analysis of optoelectronic semiconductors
title Spectroscopic analysis of optoelectronic semiconductors
title_full Spectroscopic analysis of optoelectronic semiconductors
title_fullStr Spectroscopic analysis of optoelectronic semiconductors
title_full_unstemmed Spectroscopic analysis of optoelectronic semiconductors
title_short Spectroscopic analysis of optoelectronic semiconductors
title_sort spectroscopic analysis of optoelectronic semiconductors
topic Other Fields of Physics
url https://dx.doi.org/10.1007/978-3-319-42349-4
http://cds.cern.ch/record/2213109
work_keys_str_mv AT jimenezjuan spectroscopicanalysisofoptoelectronicsemiconductors
AT tommjensw spectroscopicanalysisofoptoelectronicsemiconductors