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Thick film technology: fundamentals and applications in microelectronics

Detalles Bibliográficos
Autor principal: Agnew, Jeremy
Lenguaje:eng
Publicado: Hayden 1973
Materias:
Acceso en línea:http://cds.cern.ch/record/222825
_version_ 1780883356180807680
author Agnew, Jeremy
author_facet Agnew, Jeremy
author_sort Agnew, Jeremy
collection CERN
id cern-222825
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1973
publisher Hayden
record_format invenio
spelling cern-2228252021-04-22T04:31:11Zhttp://cds.cern.ch/record/222825engAgnew, JeremyThick film technology: fundamentals and applications in microelectronicsEngineeringHaydenoai:cds.cern.ch:2228251973
spellingShingle Engineering
Agnew, Jeremy
Thick film technology: fundamentals and applications in microelectronics
title Thick film technology: fundamentals and applications in microelectronics
title_full Thick film technology: fundamentals and applications in microelectronics
title_fullStr Thick film technology: fundamentals and applications in microelectronics
title_full_unstemmed Thick film technology: fundamentals and applications in microelectronics
title_short Thick film technology: fundamentals and applications in microelectronics
title_sort thick film technology: fundamentals and applications in microelectronics
topic Engineering
url http://cds.cern.ch/record/222825
work_keys_str_mv AT agnewjeremy thickfilmtechnologyfundamentalsandapplicationsinmicroelectronics