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Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector

The ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents associated with the FE-I4 During the first year of the IBL operation in 2015 a significan...

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Autor principal: La Rosa, Alessandro
Lenguaje:eng
Publicado: 2016
Materias:
Acceso en línea:http://cds.cern.ch/record/2229578
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author La Rosa, Alessandro
author_facet La Rosa, Alessandro
author_sort La Rosa, Alessandro
collection CERN
description The ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents associated with the FE-I4 During the first year of the IBL operation in 2015 a significant increase of the LV current of the front-end chip and the detuning of its parameters (threshold and time-over- threshold) have been observed in relation to the received TID. In this talk , the TID effects in the FE-I4 chip are reported based on studies performed in the laboratory using X-ray and proton irradiation sources for various temperature and irradiation intensity conditions. Based on these results, an operation guideline of the IBL detector is presented.
id cern-2229578
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
record_format invenio
spelling cern-22295782019-09-30T06:29:59Zhttp://cds.cern.ch/record/2229578engLa Rosa, AlessandroIrradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detectorParticle Physics - ExperimentThe ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents associated with the FE-I4 During the first year of the IBL operation in 2015 a significant increase of the LV current of the front-end chip and the detuning of its parameters (threshold and time-over- threshold) have been observed in relation to the received TID. In this talk , the TID effects in the FE-I4 chip are reported based on studies performed in the laboratory using X-ray and proton irradiation sources for various temperature and irradiation intensity conditions. Based on these results, an operation guideline of the IBL detector is presented.ATL-INDET-SLIDE-2016-836oai:cds.cern.ch:22295782016-11-03
spellingShingle Particle Physics - Experiment
La Rosa, Alessandro
Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_full Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_fullStr Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_full_unstemmed Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_short Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_sort irradiation induced effects in the fe-i4 front-end chip of the atlas ibl detector
topic Particle Physics - Experiment
url http://cds.cern.ch/record/2229578
work_keys_str_mv AT larosaalessandro irradiationinducedeffectsinthefei4frontendchipoftheatlasibldetector