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Analysis of testbeam data with inclined pALPIDE-3 chips
The ALICE ITS upgrade is planning to use monolithic pixel sensors. The behaviour of the latest prototype for different angles of incidence was investigated in testbeam measurements between July and September 2016 at the Proton Synchrotron (PS) at CERN. When trying to analyse the data, problems with...
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Lenguaje: | eng |
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2016
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Acceso en línea: | http://cds.cern.ch/record/2229745 |
_version_ | 1780952510313267200 |
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author | Brueers, Ben |
author_facet | Brueers, Ben |
author_sort | Brueers, Ben |
collection | CERN |
description | The ALICE ITS upgrade is planning to use monolithic pixel sensors. The behaviour of the latest prototype for different angles of incidence was investigated in testbeam measurements between July and September 2016 at the Proton Synchrotron (PS) at CERN. When trying to analyse the data, problems with the analysis framework EUTelescope were noticed. This report describes, how these problems could be resolved and presents the results of the data analysis. An overview of the ITS upgrade and MAPS is also given. |
id | cern-2229745 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2016 |
record_format | invenio |
spelling | cern-22297452019-09-30T06:29:59Zhttp://cds.cern.ch/record/2229745engBrueers, BenAnalysis of testbeam data with inclined pALPIDE-3 chipsPhysics in GeneralThe ALICE ITS upgrade is planning to use monolithic pixel sensors. The behaviour of the latest prototype for different angles of incidence was investigated in testbeam measurements between July and September 2016 at the Proton Synchrotron (PS) at CERN. When trying to analyse the data, problems with the analysis framework EUTelescope were noticed. This report describes, how these problems could be resolved and presents the results of the data analysis. An overview of the ITS upgrade and MAPS is also given.CERN-STUDENTS-Note-2016-262oai:cds.cern.ch:22297452016-11-04 |
spellingShingle | Physics in General Brueers, Ben Analysis of testbeam data with inclined pALPIDE-3 chips |
title | Analysis of testbeam data with inclined pALPIDE-3 chips |
title_full | Analysis of testbeam data with inclined pALPIDE-3 chips |
title_fullStr | Analysis of testbeam data with inclined pALPIDE-3 chips |
title_full_unstemmed | Analysis of testbeam data with inclined pALPIDE-3 chips |
title_short | Analysis of testbeam data with inclined pALPIDE-3 chips |
title_sort | analysis of testbeam data with inclined palpide-3 chips |
topic | Physics in General |
url | http://cds.cern.ch/record/2229745 |
work_keys_str_mv | AT brueersben analysisoftestbeamdatawithinclinedpalpide3chips |