Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector

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The ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents associated with the FE-I4 front-end chip was observed and this increase was traced back t...

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Autor principal: La Rosa, Alessandro
Lenguaje:eng
Publicado: 2016
Materias:
physics.ins-det
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/NSSMIC.2016.8069865
http://cds.cern.ch/record/2230715
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author La Rosa, Alessandro
author_facet La Rosa, Alessandro
author_sort La Rosa, Alessandro
collection CERN
description The ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents associated with the FE-I4 front-end chip was observed and this increase was traced back to the radiation damage in the chip. The dependence of the current on the total-ionising dose and temperature has been tested with X-ray and proton irradiations and will be presented in this paper together with the detector operation guidelines.
id cern-2230715
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
record_format invenio
spelling cern-22307152021-05-03T20:10:44Zdoi:10.1109/NSSMIC.2016.8069865http://cds.cern.ch/record/2230715engLa Rosa, AlessandroIrradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detectorphysics.ins-detDetectors and Experimental TechniquesThe ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents associated with the FE-I4 front-end chip was observed and this increase was traced back to the radiation damage in the chip. The dependence of the current on the total-ionising dose and temperature has been tested with X-ray and proton irradiations and will be presented in this paper together with the detector operation guidelines.The ATLAS Insertable B-Layer (IBL) detector was installed into the ATLAS experiment in 2014 and has been in operation since 2015. During the first year of IBL data taking an increase of the low voltage currents of the FE-I4 front-end chip was measured and was traced back to the radiation damage in the chip. The dependence of the current on the total ionising dose and temperature has been tested with X-ray and proton irradiations and will be presented in this paper together with the detector operation guidelines.arXiv:1611.00803oai:cds.cern.ch:22307152016-11-02
spellingShingle physics.ins-det
Detectors and Experimental Techniques
La Rosa, Alessandro
Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_full Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_fullStr Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_full_unstemmed Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_short Irradiation induced effects in the FE-I4 front-end chip of the ATLAS IBL detector
title_sort irradiation induced effects in the fe-i4 front-end chip of the atlas ibl detector
topic physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1109/NSSMIC.2016.8069865
http://cds.cern.ch/record/2230715
work_keys_str_mv AT larosaalessandro irradiationinducedeffectsinthefei4frontendchipoftheatlasibldetector

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