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Automatic analog IC sizing and optimization constrained with PVT corners and layout effects

This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the c...

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Detalles Bibliográficos
Autores principales: Lourenço, Nuno, Martins, Ricardo, Horta, Nuno
Lenguaje:eng
Publicado: Springer 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-42037-0
http://cds.cern.ch/record/2240400
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author Lourenço, Nuno
Martins, Ricardo
Horta, Nuno
author_facet Lourenço, Nuno
Martins, Ricardo
Horta, Nuno
author_sort Lourenço, Nuno
collection CERN
description This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the circuit, and on the methodologies to estimate the circuit’s performance. The discussion also includes robust circuit design and optimization and the most recent advances in layout-aware analog sizing approaches. The authors describe a methodology for an automatic flow for analog IC design, including details of the inputs and interfaces, multi-objective optimization techniques, and the enhancements made in the base implementation by using machine leaning techniques. The Gradient model is discussed in detail, along with the methods to include layout effects in the circuit sizing. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. An extensive set of application examples is included to demonstrate the capabilities and features of the methodologies described.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
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spelling cern-22404002021-04-21T19:24:20Zdoi:10.1007/978-3-319-42037-0http://cds.cern.ch/record/2240400engLourenço, NunoMartins, RicardoHorta, NunoAutomatic analog IC sizing and optimization constrained with PVT corners and layout effectsEngineeringThis book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the circuit, and on the methodologies to estimate the circuit’s performance. The discussion also includes robust circuit design and optimization and the most recent advances in layout-aware analog sizing approaches. The authors describe a methodology for an automatic flow for analog IC design, including details of the inputs and interfaces, multi-objective optimization techniques, and the enhancements made in the base implementation by using machine leaning techniques. The Gradient model is discussed in detail, along with the methods to include layout effects in the circuit sizing. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. An extensive set of application examples is included to demonstrate the capabilities and features of the methodologies described.Springeroai:cds.cern.ch:22404002017
spellingShingle Engineering
Lourenço, Nuno
Martins, Ricardo
Horta, Nuno
Automatic analog IC sizing and optimization constrained with PVT corners and layout effects
title Automatic analog IC sizing and optimization constrained with PVT corners and layout effects
title_full Automatic analog IC sizing and optimization constrained with PVT corners and layout effects
title_fullStr Automatic analog IC sizing and optimization constrained with PVT corners and layout effects
title_full_unstemmed Automatic analog IC sizing and optimization constrained with PVT corners and layout effects
title_short Automatic analog IC sizing and optimization constrained with PVT corners and layout effects
title_sort automatic analog ic sizing and optimization constrained with pvt corners and layout effects
topic Engineering
url https://dx.doi.org/10.1007/978-3-319-42037-0
http://cds.cern.ch/record/2240400
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AT martinsricardo automaticanalogicsizingandoptimizationconstrainedwithpvtcornersandlayouteffects
AT hortanuno automaticanalogicsizingandoptimizationconstrainedwithpvtcornersandlayouteffects