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Advances in speckle metrology and related techniques
Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have chang...
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Lenguaje: | eng |
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John Wiley & Sons
2010
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Acceso en línea: | http://cds.cern.ch/record/2241382 |
_version_ | 1780953193074655232 |
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author | Kaufmann, Guillermo H |
author_facet | Kaufmann, Guillermo H |
author_sort | Kaufmann, Guillermo H |
collection | CERN |
description | Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the l |
id | cern-2241382 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2010 |
publisher | John Wiley & Sons |
record_format | invenio |
spelling | cern-22413822021-04-21T19:22:45Zhttp://cds.cern.ch/record/2241382engKaufmann, Guillermo HAdvances in speckle metrology and related techniquesOther Fields of PhysicsSpeckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the lJohn Wiley & Sonsoai:cds.cern.ch:22413822010 |
spellingShingle | Other Fields of Physics Kaufmann, Guillermo H Advances in speckle metrology and related techniques |
title | Advances in speckle metrology and related techniques |
title_full | Advances in speckle metrology and related techniques |
title_fullStr | Advances in speckle metrology and related techniques |
title_full_unstemmed | Advances in speckle metrology and related techniques |
title_short | Advances in speckle metrology and related techniques |
title_sort | advances in speckle metrology and related techniques |
topic | Other Fields of Physics |
url | http://cds.cern.ch/record/2241382 |
work_keys_str_mv | AT kaufmannguillermoh advancesinspecklemetrologyandrelatedtechniques |