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Advances in speckle metrology and related techniques

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have chang...

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Detalles Bibliográficos
Autor principal: Kaufmann, Guillermo H
Lenguaje:eng
Publicado: John Wiley & Sons 2010
Materias:
Acceso en línea:http://cds.cern.ch/record/2241382
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author Kaufmann, Guillermo H
author_facet Kaufmann, Guillermo H
author_sort Kaufmann, Guillermo H
collection CERN
description Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the l
id cern-2241382
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2010
publisher John Wiley & Sons
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spelling cern-22413822021-04-21T19:22:45Zhttp://cds.cern.ch/record/2241382engKaufmann, Guillermo HAdvances in speckle metrology and related techniquesOther Fields of PhysicsSpeckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the lJohn Wiley & Sonsoai:cds.cern.ch:22413822010
spellingShingle Other Fields of Physics
Kaufmann, Guillermo H
Advances in speckle metrology and related techniques
title Advances in speckle metrology and related techniques
title_full Advances in speckle metrology and related techniques
title_fullStr Advances in speckle metrology and related techniques
title_full_unstemmed Advances in speckle metrology and related techniques
title_short Advances in speckle metrology and related techniques
title_sort advances in speckle metrology and related techniques
topic Other Fields of Physics
url http://cds.cern.ch/record/2241382
work_keys_str_mv AT kaufmannguillermoh advancesinspecklemetrologyandrelatedtechniques