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Nano semiconducting materials
The main focus of the present book is the characterization of a number of nano-semiconducting materials, using such techniques as powder X-ray diffraction, UV-visible spectrophotometry, Raman spectrometry, scanning electron microscopy, transmission electron microscopy and vibrating sample magnetomet...
Autor principal: | Saravanan, R |
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Lenguaje: | eng |
Publicado: |
Materials Research Forum
2016
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2241472 |
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