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Nano semiconducting materials

The main focus of the present book is the characterization of a number of nano-semiconducting materials, using such techniques as powder X-ray diffraction, UV-visible spectrophotometry, Raman spectrometry, scanning electron microscopy, transmission electron microscopy and vibrating sample magnetomet...

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Detalles Bibliográficos
Autor principal: Saravanan, R
Lenguaje:eng
Publicado: Materials Research Forum 2016
Materias:
Acceso en línea:http://cds.cern.ch/record/2241472

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