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Semiconductor devices in harsh conditions
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
CRC Press
2016
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2241715 |
| _version_ | 1780953233604214784 |
|---|---|
| author | Weide-Zaage, Kirsten Chrzanowska-Jeske, Malgorzata |
| author_facet | Weide-Zaage, Kirsten Chrzanowska-Jeske, Malgorzata |
| author_sort | Weide-Zaage, Kirsten |
| collection | CERN |
| id | cern-2241715 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2016 |
| publisher | CRC Press |
| record_format | invenio |
| spelling | cern-22417152021-04-21T19:22:03Zhttp://cds.cern.ch/record/2241715engWeide-Zaage, KirstenChrzanowska-Jeske, MalgorzataSemiconductor devices in harsh conditionsEngineeringCRC Pressoai:cds.cern.ch:22417152016 |
| spellingShingle | Engineering Weide-Zaage, Kirsten Chrzanowska-Jeske, Malgorzata Semiconductor devices in harsh conditions |
| title | Semiconductor devices in harsh conditions |
| title_full | Semiconductor devices in harsh conditions |
| title_fullStr | Semiconductor devices in harsh conditions |
| title_full_unstemmed | Semiconductor devices in harsh conditions |
| title_short | Semiconductor devices in harsh conditions |
| title_sort | semiconductor devices in harsh conditions |
| topic | Engineering |
| url | http://cds.cern.ch/record/2241715 |
| work_keys_str_mv | AT weidezaagekirsten semiconductordevicesinharshconditions AT chrzanowskajeskemalgorzata semiconductordevicesinharshconditions |