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Semiconductor devices in harsh conditions

Detalles Bibliográficos
Autores principales:	Weide-Zaage, Kirsten, Chrzanowska-Jeske, Malgorzata
Lenguaje:	eng
Publicado:	CRC Press 2016
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2241715

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