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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
| Autores principales: | , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2015
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/RADECS.2015.7365578 http://cds.cern.ch/record/2256763 |
| _version_ | 1780953753953763328 |
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| author | Bosser, A. Gupta, V. Tsiligiannis, G. Ferraro, R. Frost, C. Javanainen, A. Puchner, H. Rossi, M. Saigne, F. Virtanen, A. Wrobel, F. Zadeh, A. Dilillo, L. |
| author_facet | Bosser, A. Gupta, V. Tsiligiannis, G. Ferraro, R. Frost, C. Javanainen, A. Puchner, H. Rossi, M. Saigne, F. Virtanen, A. Wrobel, F. Zadeh, A. Dilillo, L. |
| author_sort | Bosser, A. |
| collection | CERN |
| description | A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions. |
| id | cern-2256763 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2015 |
| record_format | invenio |
| spelling | cern-22567632019-09-30T06:29:59Zdoi:10.1109/RADECS.2015.7365578http://cds.cern.ch/record/2256763engBosser, A.Gupta, V.Tsiligiannis, G.Ferraro, R.Frost, C.Javanainen, A.Puchner, H.Rossi, M.Saigne, F.Virtanen, A.Wrobel, F.Zadeh, A.Dilillo, L.A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and SlicingXXA methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.oai:cds.cern.ch:22567632015 |
| spellingShingle | XX Bosser, A. Gupta, V. Tsiligiannis, G. Ferraro, R. Frost, C. Javanainen, A. Puchner, H. Rossi, M. Saigne, F. Virtanen, A. Wrobel, F. Zadeh, A. Dilillo, L. A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing |
| title | A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing |
| title_full | A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing |
| title_fullStr | A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing |
| title_full_unstemmed | A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing |
| title_short | A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing |
| title_sort | methodology for the analysis of memory response to radiation through bitmap superposition and slicing |
| topic | XX |
| url | https://dx.doi.org/10.1109/RADECS.2015.7365578 http://cds.cern.ch/record/2256763 |
| work_keys_str_mv | AT bossera amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT guptav amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT tsiligiannisg amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT ferraror amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT frostc amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT javanainena amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT puchnerh amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT rossim amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT saignef amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT virtanena amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT wrobelf amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT zadeha amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT dilillol amethodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT bossera methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT guptav methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT tsiligiannisg methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT ferraror methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT frostc methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT javanainena methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT puchnerh methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT rossim methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT saignef methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT virtanena methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT wrobelf methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT zadeha methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing AT dilillol methodologyfortheanalysisofmemoryresponsetoradiationthroughbitmapsuperpositionandslicing |