A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.

Detalles Bibliográficos
Autores principales: Bosser, A., Gupta, V., Tsiligiannis, G., Ferraro, R., Frost, C., Javanainen, A., Puchner, H., Rossi, M., Saigne, F., Virtanen, A., Wrobel, F., Zadeh, A., Dilillo, L.
Lenguaje:eng
Publicado: 2015
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1109/RADECS.2015.7365578
http://cds.cern.ch/record/2256763

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