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RF and microwave microelectronics packaging II
Reviews RF, microwave, and microelectronics assembly process, quality control, and failure analysis Bridges the gap between low cost commercial and hi-res RF/Microwave packaging technologies Engages in an in-depth discussion of challenges in packaging and assembly of advanced high-power amplifiers T...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Springer
2017
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-51697-4 http://cds.cern.ch/record/2258600 |
_version_ | 1780953871886057472 |
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author | Kuang, Ken Sturdivant, Rick |
author_facet | Kuang, Ken Sturdivant, Rick |
author_sort | Kuang, Ken |
collection | CERN |
description | Reviews RF, microwave, and microelectronics assembly process, quality control, and failure analysis Bridges the gap between low cost commercial and hi-res RF/Microwave packaging technologies Engages in an in-depth discussion of challenges in packaging and assembly of advanced high-power amplifiers This book presents the latest developments in packaging for high-frequency electronics. It is a companion volume to “RF and Microwave Microelectronics Packaging” (2010) and covers the latest developments in thermal management, electrical/RF/thermal-mechanical designs and simulations, packaging and processing methods, and other RF and microwave packaging topics. Chapters provide detailed coverage of phased arrays, T/R modules, 3D transitions, high thermal conductivity materials, carbon nanotubes and graphene advanced materials, and chip size packaging for RF MEMS. It appeals to practicing engineers in the electronic packaging and high-frequency electronics domain, and to academic researchers interested in understanding the leading issues in the commercial sector. It is also a good reference and self-studying guide for students seeking future employment in consumer electronics. |
id | cern-2258600 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
publisher | Springer |
record_format | invenio |
spelling | cern-22586002021-04-21T19:17:27Zdoi:10.1007/978-3-319-51697-4http://cds.cern.ch/record/2258600engKuang, KenSturdivant, RickRF and microwave microelectronics packaging IIEngineeringReviews RF, microwave, and microelectronics assembly process, quality control, and failure analysis Bridges the gap between low cost commercial and hi-res RF/Microwave packaging technologies Engages in an in-depth discussion of challenges in packaging and assembly of advanced high-power amplifiers This book presents the latest developments in packaging for high-frequency electronics. It is a companion volume to “RF and Microwave Microelectronics Packaging” (2010) and covers the latest developments in thermal management, electrical/RF/thermal-mechanical designs and simulations, packaging and processing methods, and other RF and microwave packaging topics. Chapters provide detailed coverage of phased arrays, T/R modules, 3D transitions, high thermal conductivity materials, carbon nanotubes and graphene advanced materials, and chip size packaging for RF MEMS. It appeals to practicing engineers in the electronic packaging and high-frequency electronics domain, and to academic researchers interested in understanding the leading issues in the commercial sector. It is also a good reference and self-studying guide for students seeking future employment in consumer electronics.Springeroai:cds.cern.ch:22586002017 |
spellingShingle | Engineering Kuang, Ken Sturdivant, Rick RF and microwave microelectronics packaging II |
title | RF and microwave microelectronics packaging II |
title_full | RF and microwave microelectronics packaging II |
title_fullStr | RF and microwave microelectronics packaging II |
title_full_unstemmed | RF and microwave microelectronics packaging II |
title_short | RF and microwave microelectronics packaging II |
title_sort | rf and microwave microelectronics packaging ii |
topic | Engineering |
url | https://dx.doi.org/10.1007/978-3-319-51697-4 http://cds.cern.ch/record/2258600 |
work_keys_str_mv | AT kuangken rfandmicrowavemicroelectronicspackagingii AT sturdivantrick rfandmicrowavemicroelectronicspackagingii |