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AM chip pattern recognition with optimized ternary bit usage

The algorithms used within ATLAS to define patterns and ternary bits for the FTK system are presented and their performance is evaluated.

Detalles Bibliográficos
Autor principal: Schmitt, Stefan
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:http://cds.cern.ch/record/2259638
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author Schmitt, Stefan
author_facet Schmitt, Stefan
author_sort Schmitt, Stefan
collection CERN
description The algorithms used within ATLAS to define patterns and ternary bits for the FTK system are presented and their performance is evaluated.
id cern-2259638
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling cern-22596382019-09-30T06:29:59Zhttp://cds.cern.ch/record/2259638engSchmitt, StefanAM chip pattern recognition with optimized ternary bit usageParticle Physics - ExperimentThe algorithms used within ATLAS to define patterns and ternary bits for the FTK system are presented and their performance is evaluated.ATL-DAQ-SLIDE-2017-176oai:cds.cern.ch:22596382017-04-13
spellingShingle Particle Physics - Experiment
Schmitt, Stefan
AM chip pattern recognition with optimized ternary bit usage
title AM chip pattern recognition with optimized ternary bit usage
title_full AM chip pattern recognition with optimized ternary bit usage
title_fullStr AM chip pattern recognition with optimized ternary bit usage
title_full_unstemmed AM chip pattern recognition with optimized ternary bit usage
title_short AM chip pattern recognition with optimized ternary bit usage
title_sort am chip pattern recognition with optimized ternary bit usage
topic Particle Physics - Experiment
url http://cds.cern.ch/record/2259638
work_keys_str_mv AT schmittstefan amchippatternrecognitionwithoptimizedternarybitusage