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Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector

One of the design concepts currently under study for the vertex detector at the proposed Compact Linear Collider is a High-Voltage CMOS sensor, fabricated in a commercial 180 nm technology, capacitively coupled to a hybrid readout chip. Tests of the assemblies were carried out at the CERN SPS using...

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Autor principal: Buckland, Matthew Daniel
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-981-13-1316-5_77
http://cds.cern.ch/record/2272217
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author Buckland, Matthew Daniel
author_facet Buckland, Matthew Daniel
author_sort Buckland, Matthew Daniel
collection CERN
description One of the design concepts currently under study for the vertex detector at the proposed Compact Linear Collider is a High-Voltage CMOS sensor, fabricated in a commercial 180 nm technology, capacitively coupled to a hybrid readout chip. Tests of the assemblies were carried out at the CERN SPS using 120 GeV/c pions, covering incident angles ranging from 0$^\circ$ to 80$^\circ$. The measurements have shown an excellent tracking performance with an efficiency above 99.7% and a spatial resolution of 5–7 $\mu$m over the tested angular range. These results were then compared to TCAD simulations carried out using simulations, showing a good agreement for the current-voltage, breakdown and charge collection properties. The simulations have also been used to optimise future sensor design.
id cern-2272217
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
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spelling cern-22722172019-09-30T06:29:59Zdoi:10.1007/978-981-13-1316-5_77http://cds.cern.ch/record/2272217engBuckland, Matthew DanielAnalysis and simulation of HV-CMOS assemblies for the CLIC vertex detectorParticle Physics - ExperimentOne of the design concepts currently under study for the vertex detector at the proposed Compact Linear Collider is a High-Voltage CMOS sensor, fabricated in a commercial 180 nm technology, capacitively coupled to a hybrid readout chip. Tests of the assemblies were carried out at the CERN SPS using 120 GeV/c pions, covering incident angles ranging from 0$^\circ$ to 80$^\circ$. The measurements have shown an excellent tracking performance with an efficiency above 99.7% and a spatial resolution of 5–7 $\mu$m over the tested angular range. These results were then compared to TCAD simulations carried out using simulations, showing a good agreement for the current-voltage, breakdown and charge collection properties. The simulations have also been used to optimise future sensor design.CLICdp-Conf-2017-014oai:cds.cern.ch:22722172018
spellingShingle Particle Physics - Experiment
Buckland, Matthew Daniel
Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector
title Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector
title_full Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector
title_fullStr Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector
title_full_unstemmed Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector
title_short Analysis and simulation of HV-CMOS assemblies for the CLIC vertex detector
title_sort analysis and simulation of hv-cmos assemblies for the clic vertex detector
topic Particle Physics - Experiment
url https://dx.doi.org/10.1007/978-981-13-1316-5_77
http://cds.cern.ch/record/2272217
work_keys_str_mv AT bucklandmatthewdaniel analysisandsimulationofhvcmosassembliesfortheclicvertexdetector