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Time resolution of silicon pixel sensors

We derive expressions for the time resolution of silicon detectors, using the Landau theory and a PAI model for describing the charge deposit of high energy particles. First we use the centroid time of the induced signal and derive analytic expressions for the three components contributing to the ti...

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Detalles Bibliográficos
Autores principales: Riegler, Werner, Aglieri Rinella, Gianluca
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/12/11/P11017
http://cds.cern.ch/record/2275379
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author Riegler, Werner
Aglieri Rinella, Gianluca
author_facet Riegler, Werner
Aglieri Rinella, Gianluca
author_sort Riegler, Werner
collection CERN
description We derive expressions for the time resolution of silicon detectors, using the Landau theory and a PAI model for describing the charge deposit of high energy particles. First we use the centroid time of the induced signal and derive analytic expressions for the three components contributing to the time resolution, namely charge deposit fluctuations, noise and fluctuations of the signal shape due to weighting field variations. Then we derive expressions for the time resolution using leading edge discrimination of the signal for various electronics shaping times. Time resolution of silicon detectors with internal gain is discussed as well.
id cern-2275379
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling cern-22753792021-07-15T23:19:54Zdoi:10.1088/1748-0221/12/11/P11017http://cds.cern.ch/record/2275379engRiegler, WernerAglieri Rinella, GianlucaTime resolution of silicon pixel sensorsphysics.ins-detDetectors and Experimental TechniquesWe derive expressions for the time resolution of silicon detectors, using the Landau theory and a PAI model for describing the charge deposit of high energy particles. First we use the centroid time of the induced signal and derive analytic expressions for the three components contributing to the time resolution, namely charge deposit fluctuations, noise and fluctuations of the signal shape due to weighting field variations. Then we derive expressions for the time resolution using leading edge discrimination of the signal for various electronics shaping times. Time resolution of silicon detectors with internal gain is discussed as well.arXiv:1706.04883oai:cds.cern.ch:22753792017-06-15
spellingShingle physics.ins-det
Detectors and Experimental Techniques
Riegler, Werner
Aglieri Rinella, Gianluca
Time resolution of silicon pixel sensors
title Time resolution of silicon pixel sensors
title_full Time resolution of silicon pixel sensors
title_fullStr Time resolution of silicon pixel sensors
title_full_unstemmed Time resolution of silicon pixel sensors
title_short Time resolution of silicon pixel sensors
title_sort time resolution of silicon pixel sensors
topic physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/12/11/P11017
http://cds.cern.ch/record/2275379
work_keys_str_mv AT rieglerwerner timeresolutionofsiliconpixelsensors
AT aglieririnellagianluca timeresolutionofsiliconpixelsensors