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Time resolution of silicon pixel sensors
We derive expressions for the time resolution of silicon detectors, using the Landau theory and a PAI model for describing the charge deposit of high energy particles. First we use the centroid time of the induced signal and derive analytic expressions for the three components contributing to the ti...
Autores principales: | , |
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Lenguaje: | eng |
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2017
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/12/11/P11017 http://cds.cern.ch/record/2275379 |
_version_ | 1780955130238074880 |
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author | Riegler, Werner Aglieri Rinella, Gianluca |
author_facet | Riegler, Werner Aglieri Rinella, Gianluca |
author_sort | Riegler, Werner |
collection | CERN |
description | We derive expressions for the time resolution of silicon detectors, using the Landau theory and a PAI model for describing the charge deposit of high energy particles. First we use the centroid time of the induced signal and derive analytic expressions for the three components contributing to the time resolution, namely charge deposit fluctuations, noise and fluctuations of the signal shape due to weighting field variations. Then we derive expressions for the time resolution using leading edge discrimination of the signal for various electronics shaping times. Time resolution of silicon detectors with internal gain is discussed as well. |
id | cern-2275379 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
record_format | invenio |
spelling | cern-22753792021-07-15T23:19:54Zdoi:10.1088/1748-0221/12/11/P11017http://cds.cern.ch/record/2275379engRiegler, WernerAglieri Rinella, GianlucaTime resolution of silicon pixel sensorsphysics.ins-detDetectors and Experimental TechniquesWe derive expressions for the time resolution of silicon detectors, using the Landau theory and a PAI model for describing the charge deposit of high energy particles. First we use the centroid time of the induced signal and derive analytic expressions for the three components contributing to the time resolution, namely charge deposit fluctuations, noise and fluctuations of the signal shape due to weighting field variations. Then we derive expressions for the time resolution using leading edge discrimination of the signal for various electronics shaping times. Time resolution of silicon detectors with internal gain is discussed as well.arXiv:1706.04883oai:cds.cern.ch:22753792017-06-15 |
spellingShingle | physics.ins-det Detectors and Experimental Techniques Riegler, Werner Aglieri Rinella, Gianluca Time resolution of silicon pixel sensors |
title | Time resolution of silicon pixel sensors |
title_full | Time resolution of silicon pixel sensors |
title_fullStr | Time resolution of silicon pixel sensors |
title_full_unstemmed | Time resolution of silicon pixel sensors |
title_short | Time resolution of silicon pixel sensors |
title_sort | time resolution of silicon pixel sensors |
topic | physics.ins-det Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1088/1748-0221/12/11/P11017 http://cds.cern.ch/record/2275379 |
work_keys_str_mv | AT rieglerwerner timeresolutionofsiliconpixelsensors AT aglieririnellagianluca timeresolutionofsiliconpixelsensors |