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Physical Fault Injection and Monitoring Methods for Programmable Devices

A method of detecting faults for evaluating the fault cross section of any field programmable gate array (FPGA) was developed and is described in the thesis. The incidence of single event effects in FPGAs was studied for different probe particles (proton, neutron, gamma) using this method. The exis...

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Autor principal: Vanat, Tomas
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:http://cds.cern.ch/record/2276252
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author Vanat, Tomas
author_facet Vanat, Tomas
author_sort Vanat, Tomas
collection CERN
description A method of detecting faults for evaluating the fault cross section of any field programmable gate array (FPGA) was developed and is described in the thesis. The incidence of single event effects in FPGAs was studied for different probe particles (proton, neutron, gamma) using this method. The existing accelerator infrastructure of the Nuclear Physics Institute in Rez was supplemented by more sensitive beam monitoring system to ensure that the tests are done under well defined beam conditions. The bit cross section of single event effects was measured for different types of configuration memories, clock signal phase and beam energies and intensities. The extended infrastructure served also for radiation testing of components which are planned to be used in the new Inner Tracking System (ITS) detector of the ALICE experiment and for selecting optimal fault mitigation techniques used for securing the design of the FPGA-based ITS readout unit against faults induced by ionizing radiation.
id cern-2276252
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
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spelling cern-22762522019-09-30T06:29:59Zhttp://cds.cern.ch/record/2276252engVanat, TomasPhysical Fault Injection and Monitoring Methods for Programmable DevicesEngineeringA method of detecting faults for evaluating the fault cross section of any field programmable gate array (FPGA) was developed and is described in the thesis. The incidence of single event effects in FPGAs was studied for different probe particles (proton, neutron, gamma) using this method. The existing accelerator infrastructure of the Nuclear Physics Institute in Rez was supplemented by more sensitive beam monitoring system to ensure that the tests are done under well defined beam conditions. The bit cross section of single event effects was measured for different types of configuration memories, clock signal phase and beam energies and intensities. The extended infrastructure served also for radiation testing of components which are planned to be used in the new Inner Tracking System (ITS) detector of the ALICE experiment and for selecting optimal fault mitigation techniques used for securing the design of the FPGA-based ITS readout unit against faults induced by ionizing radiation.CERN-THESIS-2017-099oai:cds.cern.ch:22762522017-07-31T11:49:29Z
spellingShingle Engineering
Vanat, Tomas
Physical Fault Injection and Monitoring Methods for Programmable Devices
title Physical Fault Injection and Monitoring Methods for Programmable Devices
title_full Physical Fault Injection and Monitoring Methods for Programmable Devices
title_fullStr Physical Fault Injection and Monitoring Methods for Programmable Devices
title_full_unstemmed Physical Fault Injection and Monitoring Methods for Programmable Devices
title_short Physical Fault Injection and Monitoring Methods for Programmable Devices
title_sort physical fault injection and monitoring methods for programmable devices
topic Engineering
url http://cds.cern.ch/record/2276252
work_keys_str_mv AT vanattomas physicalfaultinjectionandmonitoringmethodsforprogrammabledevices