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Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip

The ALICE experiment plan to upgrade the ITS. In particular, a new high-resolution, and low mass 7-layer silicon tracker based on monolithic pixel detector In this phase of the project, beam tests of the basic component of the detector, the chip, are very important to characterize its performance....

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Autor principal: Mongkolkiattichai, Jirayu
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:http://cds.cern.ch/record/2276814
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author Mongkolkiattichai, Jirayu
author_facet Mongkolkiattichai, Jirayu
author_sort Mongkolkiattichai, Jirayu
collection CERN
description The ALICE experiment plan to upgrade the ITS. In particular, a new high-resolution, and low mass 7-layer silicon tracker based on monolithic pixel detector In this phase of the project, beam tests of the basic component of the detector, the chip, are very important to characterize its performance. The aim of my study is to establish the expected occupancy of the new chip for ITS ALICE Upgraded in beam tests with ion beams, it will help ALICE physicists to arrange the chip in appropriated position. To provide expected occupancy, dN/dy in Au + Au collisions of AGS Experiment is used to fit by Gaussian distribution and transformed via a relation of rapidity and pseudo rapidity to occupancy which depends on radius and angle. The detector should be near area of collision as soon as possible and the angle with respect to beam line depends on beam energy, 22, 24, 42 and 84 degrees for 2, 4, 6 and 8 A GeV
id cern-2276814
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
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spelling cern-22768142019-09-30T06:29:59Zhttp://cds.cern.ch/record/2276814engMongkolkiattichai, JirayuBeam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chipDetectors and Experimental TechniquesThe ALICE experiment plan to upgrade the ITS. In particular, a new high-resolution, and low mass 7-layer silicon tracker based on monolithic pixel detector In this phase of the project, beam tests of the basic component of the detector, the chip, are very important to characterize its performance. The aim of my study is to establish the expected occupancy of the new chip for ITS ALICE Upgraded in beam tests with ion beams, it will help ALICE physicists to arrange the chip in appropriated position. To provide expected occupancy, dN/dy in Au + Au collisions of AGS Experiment is used to fit by Gaussian distribution and transformed via a relation of rapidity and pseudo rapidity to occupancy which depends on radius and angle. The detector should be near area of collision as soon as possible and the angle with respect to beam line depends on beam energy, 22, 24, 42 and 84 degrees for 2, 4, 6 and 8 A GeVCERN-STUDENTS-Note-2017-004oai:cds.cern.ch:22768142017-08-03
spellingShingle Detectors and Experimental Techniques
Mongkolkiattichai, Jirayu
Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
title Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
title_full Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
title_fullStr Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
title_full_unstemmed Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
title_short Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
title_sort beam test of the upgraded alice its detector with ion beam: study of the expected charged particle occupancy on the chip
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/2276814
work_keys_str_mv AT mongkolkiattichaijirayu beamtestoftheupgradedaliceitsdetectorwithionbeamstudyoftheexpectedchargedparticleoccupancyonthechip