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Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip
The ALICE experiment plan to upgrade the ITS. In particular, a new high-resolution, and low mass 7-layer silicon tracker based on monolithic pixel detector In this phase of the project, beam tests of the basic component of the detector, the chip, are very important to characterize its performance....
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Lenguaje: | eng |
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2017
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Acceso en línea: | http://cds.cern.ch/record/2276814 |
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author | Mongkolkiattichai, Jirayu |
author_facet | Mongkolkiattichai, Jirayu |
author_sort | Mongkolkiattichai, Jirayu |
collection | CERN |
description | The ALICE experiment plan to upgrade the ITS. In particular, a new high-resolution, and low mass 7-layer silicon tracker based on monolithic pixel detector In this phase of the project, beam tests of the basic component of the detector, the chip, are very important to characterize its performance. The aim of my study is to establish the expected occupancy of the new chip for ITS ALICE Upgraded in beam tests with ion beams, it will help ALICE physicists to arrange the chip in appropriated position. To provide expected occupancy, dN/dy in Au + Au collisions of AGS Experiment is used to fit by Gaussian distribution and transformed via a relation of rapidity and pseudo rapidity to occupancy which depends on radius and angle. The detector should be near area of collision as soon as possible and the angle with respect to beam line depends on beam energy, 22, 24, 42 and 84 degrees for 2, 4, 6 and 8 A GeV |
id | cern-2276814 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
record_format | invenio |
spelling | cern-22768142019-09-30T06:29:59Zhttp://cds.cern.ch/record/2276814engMongkolkiattichai, JirayuBeam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chipDetectors and Experimental TechniquesThe ALICE experiment plan to upgrade the ITS. In particular, a new high-resolution, and low mass 7-layer silicon tracker based on monolithic pixel detector In this phase of the project, beam tests of the basic component of the detector, the chip, are very important to characterize its performance. The aim of my study is to establish the expected occupancy of the new chip for ITS ALICE Upgraded in beam tests with ion beams, it will help ALICE physicists to arrange the chip in appropriated position. To provide expected occupancy, dN/dy in Au + Au collisions of AGS Experiment is used to fit by Gaussian distribution and transformed via a relation of rapidity and pseudo rapidity to occupancy which depends on radius and angle. The detector should be near area of collision as soon as possible and the angle with respect to beam line depends on beam energy, 22, 24, 42 and 84 degrees for 2, 4, 6 and 8 A GeVCERN-STUDENTS-Note-2017-004oai:cds.cern.ch:22768142017-08-03 |
spellingShingle | Detectors and Experimental Techniques Mongkolkiattichai, Jirayu Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip |
title | Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip |
title_full | Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip |
title_fullStr | Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip |
title_full_unstemmed | Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip |
title_short | Beam test of the upgraded ALICE ITS detector with ion beam: Study of the expected charged particle occupancy on the chip |
title_sort | beam test of the upgraded alice its detector with ion beam: study of the expected charged particle occupancy on the chip |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/2276814 |
work_keys_str_mv | AT mongkolkiattichaijirayu beamtestoftheupgradedaliceitsdetectorwithionbeamstudyoftheexpectedchargedparticleoccupancyonthechip |