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An automatic method to analyze the Capacity-Voltage and Current-Voltage curves of a sensor
An automatic method to perform Capacity versus voltage analysis for all kind of silicon sensor is provided. It successfully calculates the depletion voltage to unirradiated and irradiated sensors, and with measurements with outliers or reaching breakdown. It is built using C++ and using ROOT trees w...
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| Lenguaje: | eng |
| Publicado: |
2017
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| Acceso en línea: | http://cds.cern.ch/record/2281851 |