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Analog sampling techniques in CMOS technology for future front ends
| Autores principales: | , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1991
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/228281 |
| _version_ | 1780883820342411264 |
|---|---|
| author | Anghinolfi, Francis Aspell, P Campbell, M Heijne, Erik H M Jarron, Pierre Verweij, H Santiard, Jean-Claude |
| author_facet | Anghinolfi, Francis Aspell, P Campbell, M Heijne, Erik H M Jarron, Pierre Verweij, H Santiard, Jean-Claude |
| author_sort | Anghinolfi, Francis |
| collection | CERN |
| id | cern-228281 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1991 |
| record_format | invenio |
| spelling | cern-2282812019-09-30T06:29:59Zhttp://cds.cern.ch/record/228281engAnghinolfi, FrancisAspell, PCampbell, MHeijne, Erik H MJarron, PierreVerweij, HSantiard, Jean-ClaudeAnalog sampling techniques in CMOS technology for future front endsDetectors and Experimental TechniquesCERN-ECP-91-024CERN-ECP-91-24oai:cds.cern.ch:2282811991-12-13 |
| spellingShingle | Detectors and Experimental Techniques Anghinolfi, Francis Aspell, P Campbell, M Heijne, Erik H M Jarron, Pierre Verweij, H Santiard, Jean-Claude Analog sampling techniques in CMOS technology for future front ends |
| title | Analog sampling techniques in CMOS technology for future front ends |
| title_full | Analog sampling techniques in CMOS technology for future front ends |
| title_fullStr | Analog sampling techniques in CMOS technology for future front ends |
| title_full_unstemmed | Analog sampling techniques in CMOS technology for future front ends |
| title_short | Analog sampling techniques in CMOS technology for future front ends |
| title_sort | analog sampling techniques in cmos technology for future front ends |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/228281 |
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