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Analog sampling techniques in CMOS technology for future front ends

Detalles Bibliográficos
Autores principales:	Anghinolfi, Francis, Aspell, P, Campbell, M, Heijne, Erik H M, Jarron, Pierre, Verweij, H, Santiard, Jean-Claude
Lenguaje:	eng
Publicado:	1991
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/228281

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