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Migration imaging of the transient electromagnetic method

Detalles Bibliográficos
Autores principales: Li, Xiu, Xue, Guoqiang, Yin, Changchun
Lenguaje:eng
Publicado: Springer 2016
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2283568
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author Li, Xiu
Xue, Guoqiang
Yin, Changchun
author_facet Li, Xiu
Xue, Guoqiang
Yin, Changchun
author_sort Li, Xiu
collection CERN
id cern-2283568
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2016
publisher Springer
record_format invenio
spelling cern-22835682021-04-21T19:03:59Zhttp://cds.cern.ch/record/2283568engLi, XiuXue, GuoqiangYin, ChangchunMigration imaging of the transient electromagnetic methodXXSpringeroai:cds.cern.ch:22835682016
spellingShingle XX
Li, Xiu
Xue, Guoqiang
Yin, Changchun
Migration imaging of the transient electromagnetic method
title Migration imaging of the transient electromagnetic method
title_full Migration imaging of the transient electromagnetic method
title_fullStr Migration imaging of the transient electromagnetic method
title_full_unstemmed Migration imaging of the transient electromagnetic method
title_short Migration imaging of the transient electromagnetic method
title_sort migration imaging of the transient electromagnetic method
topic XX
url http://cds.cern.ch/record/2283568
work_keys_str_mv AT lixiu migrationimagingofthetransientelectromagneticmethod
AT xueguoqiang migrationimagingofthetransientelectromagneticmethod
AT yinchangchun migrationimagingofthetransientelectromagneticmethod