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Two methods for the exact solution of diffraction problems
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Lenguaje: | eng |
Publicado: |
Society of Photo-Optical Instrumentation Engineers (SPIE)
2003
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2283901 |
_version_ | 1780955794651480064 |
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author | Alzofon, Frederick E |
author_facet | Alzofon, Frederick E |
author_sort | Alzofon, Frederick E |
collection | CERN |
id | cern-2283901 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2003 |
publisher | Society of Photo-Optical Instrumentation Engineers (SPIE) |
record_format | invenio |
spelling | cern-22839012021-04-21T19:03:24Zhttp://cds.cern.ch/record/2283901engAlzofon, Frederick ETwo methods for the exact solution of diffraction problemsXXSociety of Photo-Optical Instrumentation Engineers (SPIE)oai:cds.cern.ch:22839012003 |
spellingShingle | XX Alzofon, Frederick E Two methods for the exact solution of diffraction problems |
title | Two methods for the exact solution of diffraction problems |
title_full | Two methods for the exact solution of diffraction problems |
title_fullStr | Two methods for the exact solution of diffraction problems |
title_full_unstemmed | Two methods for the exact solution of diffraction problems |
title_short | Two methods for the exact solution of diffraction problems |
title_sort | two methods for the exact solution of diffraction problems |
topic | XX |
url | http://cds.cern.ch/record/2283901 |
work_keys_str_mv | AT alzofonfredericke twomethodsfortheexactsolutionofdiffractionproblems |