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Signal coupling to embedded pitch adapters in silicon sensors

We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed sig...

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Detalles Bibliográficos
Autores principales: Artuso, M., Betancourt, C., Bezshyiko, I., Blusk, S., Bruendler, R., Bugiel, S., Dasgupta, R., Dendek, A., Dey, B., Ely, S., Lionetto, F., Petruzzo, M., Polyakov, I., Rudolph, M., Schindler, H., Steinkamp, O., Stone, S.
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2017.09.039
http://cds.cern.ch/record/2284136
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author Artuso, M.
Betancourt, C.
Bezshyiko, I.
Blusk, S.
Bruendler, R.
Bugiel, S.
Dasgupta, R.
Dendek, A.
Dey, B.
Ely, S.
Lionetto, F.
Petruzzo, M.
Polyakov, I.
Rudolph, M.
Schindler, H.
Steinkamp, O.
Stone, S.
author_facet Artuso, M.
Betancourt, C.
Bezshyiko, I.
Blusk, S.
Bruendler, R.
Bugiel, S.
Dasgupta, R.
Dendek, A.
Dey, B.
Ely, S.
Lionetto, F.
Petruzzo, M.
Polyakov, I.
Rudolph, M.
Schindler, H.
Steinkamp, O.
Stone, S.
author_sort Artuso, M.
collection CERN
description We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.
id cern-2284136
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling cern-22841362021-11-13T11:27:50Zdoi:10.1016/j.nima.2017.09.039http://cds.cern.ch/record/2284136engArtuso, M.Betancourt, C.Bezshyiko, I.Blusk, S.Bruendler, R.Bugiel, S.Dasgupta, R.Dendek, A.Dey, B.Ely, S.Lionetto, F.Petruzzo, M.Polyakov, I.Rudolph, M.Schindler, H.Steinkamp, O.Stone, S.Signal coupling to embedded pitch adapters in silicon sensorsphysics.ins-detDetectors and Experimental TechniquesWe have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.arXiv:1708.03371oai:cds.cern.ch:22841362017-08-10
spellingShingle physics.ins-det
Detectors and Experimental Techniques
Artuso, M.
Betancourt, C.
Bezshyiko, I.
Blusk, S.
Bruendler, R.
Bugiel, S.
Dasgupta, R.
Dendek, A.
Dey, B.
Ely, S.
Lionetto, F.
Petruzzo, M.
Polyakov, I.
Rudolph, M.
Schindler, H.
Steinkamp, O.
Stone, S.
Signal coupling to embedded pitch adapters in silicon sensors
title Signal coupling to embedded pitch adapters in silicon sensors
title_full Signal coupling to embedded pitch adapters in silicon sensors
title_fullStr Signal coupling to embedded pitch adapters in silicon sensors
title_full_unstemmed Signal coupling to embedded pitch adapters in silicon sensors
title_short Signal coupling to embedded pitch adapters in silicon sensors
title_sort signal coupling to embedded pitch adapters in silicon sensors
topic physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2017.09.039
http://cds.cern.ch/record/2284136
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