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Acceptor Removal in Silicon Devices for the HL-LHC
In the course of my summer student project at CERN I used several characterization techniques to study changes in the detector properties after irradiation. Thereby I focused on annealing related effects on the leakage current and the depletion voltage of the sensors performing CV/IV measurements. A...
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| Lenguaje: | eng |
| Publicado: |
2017
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| Acceso en línea: | http://cds.cern.ch/record/2285409 |
| Sumario: | In the course of my summer student project at CERN I used several characterization techniques to study changes in the detector properties after irradiation. Thereby I focused on annealing related effects on the leakage current and the depletion voltage of the sensors performing CV/IV measurements. Additionally transient current technique (TCT) is used to crossckeck results from CV/IV and get insight on the impact of annealing on the electric field shape. |
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