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Characterization of organic thin films
Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the Materials Characterization series introduces the major common types of analysis used in characterizin...
Autores principales: | Ulman, Abraham, Brundle, C Richard, Evans, Charles A |
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Lenguaje: | eng |
Publicado: |
Momentum Press
2009
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2288711 |
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