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Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection

Segmented silicon detectors (micropixel and microstrip) are the main type of detectors used in the inner trackers of Large Hadron Collider (LHC) experiments at CERN. Due to the high luminosity and eventual high fluence of energetic particles, detectors with fast response to fit the short shaping tim...

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Autores principales: Peltola, Timo, Eremin, Vladimir, Verbitskaya, Elena, Härkönen, Jaakko
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/12/09/P09032
http://cds.cern.ch/record/2289496
_version_ 1780956257779187712
author Peltola, Timo
Eremin, Vladimir
Verbitskaya, Elena
Härkönen, Jaakko
author_facet Peltola, Timo
Eremin, Vladimir
Verbitskaya, Elena
Härkönen, Jaakko
author_sort Peltola, Timo
collection CERN
description Segmented silicon detectors (micropixel and microstrip) are the main type of detectors used in the inner trackers of Large Hadron Collider (LHC) experiments at CERN. Due to the high luminosity and eventual high fluence of energetic particles, detectors with fast response to fit the short shaping time of 20–25 ns and sufficient radiation hardness are required. Charge collection measurements carried out at the Ioffe Institute have shown a reversal of the pulse polarity in the detector response to short-range charge injection. Since the measured negative signal is about 30–60% of the peak positive signal, the effect strongly reduces the CCE even in non-irradiated detectors. For further investigation of the phenomenon the measurements have been reproduced by TCAD simulations. As for the measurements, the simulation study was applied for the p-on-n strip detectors similar in geometry to those developed for the ATLAS experiment and for the Ioffe Institute designed p-on-n strip detectors with each strip having a window in the metallization covering the p(+) implant, allowing the generation of electron-hole pairs under the strip implant. Red laser scans across the strips and the interstrip gap with varying laser diameters and Si-SiO(2) interface charge densities (Q(f)) were carried out. The results verify the experimentally observed negative response along the scan in the interstrip gap. When the laser spot is positioned on the strip p(+) implant the negative response vanishes and the collected charge at the active strip increases respectively. The simulation results offer a further insight and understanding of the influence of the oxide charge density in the signal formation. The main result of the study is that a threshold value of Q(f), that enables negligible losses of collected charges, is defined. The observed effects and details of the detector response for different charge injection positions are discussed in the context of Ramo's theorem.
id cern-2289496
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling cern-22894962023-05-26T02:23:49Zdoi:10.1088/1748-0221/12/09/P09032doi:10.1088/1748-0221/12/09/P09032http://cds.cern.ch/record/2289496engPeltola, TimoEremin, VladimirVerbitskaya, ElenaHärkönen, JaakkoSimulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injectionphysics.ins-detDetectors and Experimental TechniquesSegmented silicon detectors (micropixel and microstrip) are the main type of detectors used in the inner trackers of Large Hadron Collider (LHC) experiments at CERN. Due to the high luminosity and eventual high fluence of energetic particles, detectors with fast response to fit the short shaping time of 20–25 ns and sufficient radiation hardness are required. Charge collection measurements carried out at the Ioffe Institute have shown a reversal of the pulse polarity in the detector response to short-range charge injection. Since the measured negative signal is about 30–60% of the peak positive signal, the effect strongly reduces the CCE even in non-irradiated detectors. For further investigation of the phenomenon the measurements have been reproduced by TCAD simulations. As for the measurements, the simulation study was applied for the p-on-n strip detectors similar in geometry to those developed for the ATLAS experiment and for the Ioffe Institute designed p-on-n strip detectors with each strip having a window in the metallization covering the p(+) implant, allowing the generation of electron-hole pairs under the strip implant. Red laser scans across the strips and the interstrip gap with varying laser diameters and Si-SiO(2) interface charge densities (Q(f)) were carried out. The results verify the experimentally observed negative response along the scan in the interstrip gap. When the laser spot is positioned on the strip p(+) implant the negative response vanishes and the collected charge at the active strip increases respectively. The simulation results offer a further insight and understanding of the influence of the oxide charge density in the signal formation. The main result of the study is that a threshold value of Q(f), that enables negligible losses of collected charges, is defined. The observed effects and details of the detector response for different charge injection positions are discussed in the context of Ramo's theorem.Segmented silicon detectors (micropixel and microstrip) are the main type of detectors used in the inner trackers of Large Hadron Collider (LHC) experiments at CERN. Due to the high luminosity and eventual high fluence, detectors with fast response to fit the short shaping time of 20 ns and sufficient radiation hardness are required. Measurements carried out at the Ioffe Institute have shown a reversal of the pulse polarity in the detector response to short-range charge injection. Since the measured negative signal is about 30-60% of the peak positive signal, the effect strongly reduces the CCE even in non-irradiated detectors. For further investigation of the phenomenon the measurements have been reproduced by TCAD simulations. As for the measurements, the simulation study was applied for the p-on-n strip detectors similar in geometry to those developed for the ATLAS experiment and for the Ioffe Institute designed p-on-n strip detectors with each strip having a window in the metallization covering the p$^+$ implant, allowing the generation of electron-hole pairs under the strip implant. Red laser scans across the strips and the interstrip gap with varying laser diameters and Si-SiO$_2$ interface charge densities were carried out. The results verify the experimentally observed negative response along the scan in the interstrip gap. When the laser spot is positioned on the strip p$^+$ implant the negative response vanishes and the collected charge at the active strip proportionally increases. The simulation results offer a further insight and understanding of the influence of the oxide charge density in the signal formation. The observed effects and details of the detector response for different charge injection positions are discussed in the context of Ramo's theorem.arXiv:1704.03442oai:cds.cern.ch:22894962017-04-11
spellingShingle physics.ins-det
Detectors and Experimental Techniques
Peltola, Timo
Eremin, Vladimir
Verbitskaya, Elena
Härkönen, Jaakko
Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
title Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
title_full Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
title_fullStr Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
title_full_unstemmed Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
title_short Simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
title_sort simulation study of signal formation in position sensitive planar p-on-n silicon detectors after short range charge injection
topic physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/12/09/P09032
https://dx.doi.org/10.1088/1748-0221/12/09/P09032
http://cds.cern.ch/record/2289496
work_keys_str_mv AT peltolatimo simulationstudyofsignalformationinpositionsensitiveplanarponnsilicondetectorsaftershortrangechargeinjection
AT ereminvladimir simulationstudyofsignalformationinpositionsensitiveplanarponnsilicondetectorsaftershortrangechargeinjection
AT verbitskayaelena simulationstudyofsignalformationinpositionsensitiveplanarponnsilicondetectorsaftershortrangechargeinjection
AT harkonenjaakko simulationstudyofsignalformationinpositionsensitiveplanarponnsilicondetectorsaftershortrangechargeinjection