Cargando…

Final design review of 65nm CMOS chips

Detalles Bibliográficos
Autor principal: Re, Valerio
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:http://cds.cern.ch/record/2290183
_version_ 1780956291763535872
author Re, Valerio
author_facet Re, Valerio
author_sort Re, Valerio
collection CERN
format info:eu-repo/semantics/article
id cern-2290183
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling cern-22901832019-09-30T06:29:59Z http://cds.cern.ch/record/2290183 eng Re, Valerio Final design review of 65nm CMOS chips Detectors and Experimental Techniques 4: Micro-electronics and interconnections info:eu-repo/grantAgreement/EC/FP7/654168 info:eu-repo/semantics/openAccess Education Level info:eu-repo/semantics/article http://cds.cern.ch/record/2290183 2017
spellingShingle Detectors and Experimental Techniques
4: Micro-electronics and interconnections
Re, Valerio
Final design review of 65nm CMOS chips
title Final design review of 65nm CMOS chips
title_full Final design review of 65nm CMOS chips
title_fullStr Final design review of 65nm CMOS chips
title_full_unstemmed Final design review of 65nm CMOS chips
title_short Final design review of 65nm CMOS chips
title_sort final design review of 65nm cmos chips
topic Detectors and Experimental Techniques
4: Micro-electronics and interconnections
url http://cds.cern.ch/record/2290183
http://cds.cern.ch/record/2290183
work_keys_str_mv AT revalerio finaldesignreviewof65nmcmoschips