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Exam cram CompTIA security+ SY0-501

Detalles Bibliográficos
Autores principales: Barrett, Diane, Weiss, Martin
Lenguaje:eng
Publicado: Pearson IT Certification 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2300497
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author Barrett, Diane
Weiss, Martin
author_facet Barrett, Diane
Weiss, Martin
author_sort Barrett, Diane
collection CERN
id cern-2300497
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
publisher Pearson IT Certification
record_format invenio
spelling cern-23004972021-04-21T18:56:46Zhttp://cds.cern.ch/record/2300497engBarrett, DianeWeiss, MartinExam cram CompTIA security+ SY0-501Computing and ComputersPearson IT Certificationoai:cds.cern.ch:23004972018
spellingShingle Computing and Computers
Barrett, Diane
Weiss, Martin
Exam cram CompTIA security+ SY0-501
title Exam cram CompTIA security+ SY0-501
title_full Exam cram CompTIA security+ SY0-501
title_fullStr Exam cram CompTIA security+ SY0-501
title_full_unstemmed Exam cram CompTIA security+ SY0-501
title_short Exam cram CompTIA security+ SY0-501
title_sort exam cram comptia security+ sy0-501
topic Computing and Computers
url http://cds.cern.ch/record/2300497
work_keys_str_mv AT barrettdiane examcramcomptiasecuritysy0501
AT weissmartin examcramcomptiasecuritysy0501