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Confocal Raman microscopy
This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman im...
Autores principales: | Toporski, Jan, Dieing, Thomas, Hollricher, Olaf |
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Lenguaje: | eng |
Publicado: |
Springer
2018
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-75380-5 http://cds.cern.ch/record/2306943 |
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