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Optical characterization of thin solid films
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant researc...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Springer
2018
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-75325-6 http://cds.cern.ch/record/2311289 |
_version_ | 1780957877778776064 |
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author | Stenzel, Olaf Ohlídal, Miloslav |
author_facet | Stenzel, Olaf Ohlídal, Miloslav |
author_sort | Stenzel, Olaf |
collection | CERN |
description | This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects. |
id | cern-2311289 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2018 |
publisher | Springer |
record_format | invenio |
spelling | cern-23112892021-04-21T18:52:29Zdoi:10.1007/978-3-319-75325-6http://cds.cern.ch/record/2311289engStenzel, OlafOhlídal, MiloslavOptical characterization of thin solid filmsEngineeringThis book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.Springeroai:cds.cern.ch:23112892018 |
spellingShingle | Engineering Stenzel, Olaf Ohlídal, Miloslav Optical characterization of thin solid films |
title | Optical characterization of thin solid films |
title_full | Optical characterization of thin solid films |
title_fullStr | Optical characterization of thin solid films |
title_full_unstemmed | Optical characterization of thin solid films |
title_short | Optical characterization of thin solid films |
title_sort | optical characterization of thin solid films |
topic | Engineering |
url | https://dx.doi.org/10.1007/978-3-319-75325-6 http://cds.cern.ch/record/2311289 |
work_keys_str_mv | AT stenzelolaf opticalcharacterizationofthinsolidfilms AT ohlidalmiloslav opticalcharacterizationofthinsolidfilms |