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Kelvin probe force microscopy: from single charge detection to device characterization
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular...
| Autores principales: | , |
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| Lenguaje: | eng |
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Springer
2018
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| Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-75687-5 http://cds.cern.ch/record/2311290 |