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Particle and particle systems characterization: small-angle scattering (SAS) applications

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in...

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Detalles Bibliográficos
Autor principal: Gille, Wilfried
Lenguaje:eng
Publicado: Chapman and Hall/CRC 2016
Materias:
Acceso en línea:http://cds.cern.ch/record/2311815
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author Gille, Wilfried
author_facet Gille, Wilfried
author_sort Gille, Wilfried
collection CERN
description Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples. Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.
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institution Organización Europea para la Investigación Nuclear
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publisher Chapman and Hall/CRC
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spelling cern-23118152021-04-21T18:51:50Zhttp://cds.cern.ch/record/2311815engGille, WilfriedParticle and particle systems characterization: small-angle scattering (SAS) applicationsOther Fields of PhysicsSmall-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples. Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.Chapman and Hall/CRCoai:cds.cern.ch:23118152016
spellingShingle Other Fields of Physics
Gille, Wilfried
Particle and particle systems characterization: small-angle scattering (SAS) applications
title Particle and particle systems characterization: small-angle scattering (SAS) applications
title_full Particle and particle systems characterization: small-angle scattering (SAS) applications
title_fullStr Particle and particle systems characterization: small-angle scattering (SAS) applications
title_full_unstemmed Particle and particle systems characterization: small-angle scattering (SAS) applications
title_short Particle and particle systems characterization: small-angle scattering (SAS) applications
title_sort particle and particle systems characterization: small-angle scattering (sas) applications
topic Other Fields of Physics
url http://cds.cern.ch/record/2311815
work_keys_str_mv AT gillewilfried particleandparticlesystemscharacterizationsmallanglescatteringsasapplications