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Particle and particle systems characterization: small-angle scattering (SAS) applications

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in...

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Detalles Bibliográficos
Autor principal: Gille, Wilfried
Lenguaje:eng
Publicado: Chapman and Hall/CRC 2016
Materias:
Acceso en línea:http://cds.cern.ch/record/2311815

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