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Particle and particle systems characterization: small-angle scattering (SAS) applications
Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in...
Autor principal: | Gille, Wilfried |
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Lenguaje: | eng |
Publicado: |
Chapman and Hall/CRC
2016
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2311815 |
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