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Materials analysis by ion channeling: submicron crystallography
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
Elsevier Science & Technology
2012
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2317680 |
_version_ | 1780958314670063616 |
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author | Feldman, Leonard C Mayer, James W Picraux, Steward T A |
author_facet | Feldman, Leonard C Mayer, James W Picraux, Steward T A |
author_sort | Feldman, Leonard C |
collection | CERN |
id | cern-2317680 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2012 |
publisher | Elsevier Science & Technology |
record_format | invenio |
spelling | cern-23176802021-04-21T18:50:01Zhttp://cds.cern.ch/record/2317680engFeldman, Leonard CMayer, James WPicraux, Steward T AMaterials analysis by ion channeling: submicron crystallographyOther Fields of PhysicsElsevier Science & Technologyoai:cds.cern.ch:23176802012 |
spellingShingle | Other Fields of Physics Feldman, Leonard C Mayer, James W Picraux, Steward T A Materials analysis by ion channeling: submicron crystallography |
title | Materials analysis by ion channeling: submicron crystallography |
title_full | Materials analysis by ion channeling: submicron crystallography |
title_fullStr | Materials analysis by ion channeling: submicron crystallography |
title_full_unstemmed | Materials analysis by ion channeling: submicron crystallography |
title_short | Materials analysis by ion channeling: submicron crystallography |
title_sort | materials analysis by ion channeling: submicron crystallography |
topic | Other Fields of Physics |
url | http://cds.cern.ch/record/2317680 |
work_keys_str_mv | AT feldmanleonardc materialsanalysisbyionchannelingsubmicroncrystallography AT mayerjamesw materialsanalysisbyionchannelingsubmicroncrystallography AT picrauxstewardta materialsanalysisbyionchannelingsubmicroncrystallography |